Veeco™ dual chamber Molecular Beam Epitaxy (MBE) system

The MBE can handle up to 4” dia. substrates. One chamber has oxygen plasma as well as e-beam evaporation capability and is used for reactive deposition of oxides. The second chamber is dedicated for semiconductor compounds. Veeco's GEN20™ MBE system is an ultra-flexible tool with a design configurable for III-V and emerging materials, including applications that require the integration of e-beam technology. The system incorporates production design technology that allows for an optional cluster tool wafer transfer system for an ideal lab-tofab migration.

Scanning Auger Microprobe (SAM)

The Scanning Auger Microprobe (SAM) technique is a highly versatile surface analysis technique that allows for precise and accurate mapping of the elemental composition of materials at the micrometer scale. This technique is based on the Auger electron spectroscopy (AES) principle, which is a wellestablished analytical technique used to study the surface chemistry of materials. The SAM technique is a variation of AES, which involves scanning a small electron beam over the sample surface to generate a two-dimensional elemental map of the surface.

Areej Mesleh, Hanan Ehtewish, Katie Lennard, Houari Abdesselem, Fouad Al- Shaban, Julie Decock, Nehad M. Alajez, Abdelilah Arredouani, Mohamed M. Emara, Omar Albagha, Lawrence w. Stanton, Sara A. Abdulla, Jonathan M. Blackburn, Omar M.A. El-Agnaf. High-th

Areej Mesleh, Hanan Ehtewish, Katie Lennard, Houari Abdesselem, Fouad Al- Shaban, Julie Decock, Nehad M. Alajez, Abdelilah Arredouani, Mohamed M. Emara, Omar Albagha, Lawrence w. Stanton, Sara A. Abdulla, Jonathan M. Blackburn, Omar M.A. El-Agnaf. High-throughput Autoantibody Screening Identifies Differentially Abundant Autoantibodies in Autism Spectrum Disorder. Frontiers in Molecular Neuroscience, section Brain Disease Mechanisms. Accepted, Sep 2023.

General Sample Preparation

Sectioning is a technique used to reduce specimen size for easier handling and to fit in other equipment. Buehler IsoMet 5000 Linear Precision Saw The IsoMet 5000 linear precision saw is capable of automated and repeatable sectioning of hard materials. It also includes a smart cut function where it reduces the feed rate when hitting a particularly hard section to prevent damaging the sample and the machine.

Schmidt F, Abdesselem HB, Suhre K, Sohail MU, Al-Nesf M, Bensmail I, Mashod F, Sarwath H, Bernhardt J, Tan T.M, Morris P.E, Schenck E.J, Price D, Vaikath N.N, Mohamed-Ali V, Al-Maadheed M, Arredouani A, Decock J, Blackburn J.M, Choi A.M.K, and El-Agnaf O.

Schmidt F, Abdesselem HB, Suhre K, Sohail MU, Al-Nesf M, Bensmail I, Mashod F, Sarwath H, Bernhardt J, Tan T.M, Morris P.E, Schenck E.J, Price D, Vaikath N.N, Mohamed-Ali V, Al-Maadheed M, Arredouani A, Decock J, Blackburn J.M, Choi A.M.K, and El-Agnaf O.M. Auto-Immunoproteomics Analysis of COVID-19 ICU Patients Revealed Increased Levels of Autoantibodies Related to Male Reproductive System. Front Physiol. 2023 Jul 14;14:1203723. doi: 10.3389/fphys.2023.1203723. eCollection 2023. PMID: 37520825.

Differential Scanning Calorimetry (DSC)

Differential scanning calorimetry (DSC) is a widely used technique in materials science to investigate the thermal behavior of materials. The technique involves measuring the difference in heat flow between a sample and a reference material as the temperature is changed over a certain range. The sample is heated or cooled at a controlled rate, and the heat flow into or out of the sample is monitored using a set of thermocouples.

Profilometry

Profilometry is a branch of metrology that deals with the measurement and analysis of surface topography, focusing on the examination of surface roughness, waviness, and other surface features. By understanding a material's surface properties, researchers and engineers can optimize performance, durability, and functionality in various applications, such as electronics, optics, and medical devices. The fundamental theory behind profilometry involves capturing the height variations across a surface and analyzing the resulting profile data to quantify its characteristics.

Spectroscopic Ellipsometry

Spectroscopic ellipsometry is a powerful technique for characterizing the optical properties of thin films and surface layers. It is based on the measurement of the change in polarization of light as it interacts with a sample. When light is reflected from a surface, the reflected light has a polarization state that depends on the optical properties of the material. By measuring the change in polarization, spectroscopic ellipsometry can provide information about the thickness, refractive index, and extinction coefficient of the sample.