Profilometry is a branch of metrology that deals with the measurement and analysis of surface topography, focusing on the examination of surface roughness, waviness, and other surface features. By understanding a material's surface properties, researchers and engineers can optimize performance, durability, and functionality in various applications, such as electronics, optics, and medical devices. The fundamental theory behind profilometry involves capturing the height variations across a surface and analyzing the resulting profile data to quantify its characteristics.