Small-Angle X-ray Scattering (SAXS)
Small Angle X-Ray Scattering (SAXS) is a powerful analytical technique used to study the nanostructure and morphology of materials. The X-ray source emits an X-ray beam that interacts with the electrons of the sample and is scattered. The detected scattering pattern is characteristic for the nanostructures of the sample and can be used to determine important structural parameters such as particle size