The Scanning Auger Microprobe (SAM) technique is a highly versatile surface analysis technique that allows for precise and accurate mapping of the elemental composition of materials at the micrometer scale. This technique is based on the Auger electron spectroscopy (AES) principle, which is a wellestablished analytical technique used to study the surface chemistry of materials. The SAM technique is a variation of AES, which involves scanning a small electron beam over the sample surface to generate a two-dimensional elemental map of the surface.