Electron Probe Microanalysis (EPMA) is an analytical technique used to determine the elemental composition of a solid sample at the micrometer scale. EPMA is based on the principles of Xray emission spectroscopy, and it combines the imaging capabilities of an electron microscope with the quantitative elemental analysis capabilities of an X-ray spectrometer. The technique is widely employed in various fields, such as materials science, geology, metallurgy, and semiconductor research, for studying both the composition and microstructure of materials.

The Gatan Precision Ion Polishing System II is used to mill dimpled samples to electron transparency as a cheaper alternative to FIB milling. It is also used to clean unwanted redeposition off of TEM lamellae made by FIB.

FT-IR stands for Fourier Transform InfraRed, the preferred method of infrared spectroscopy. In infrared spectroscopy, IR radiation is passed through a sample. Some of the infrared radiation is absorbed by the sample and some of it is passed through (transmitted). The resulting spectrum represents the molecular absorption and transmission, creating a molecular fingerprint of the sample. Like a fingerprint, no two unique molecular structures produce the same infrared spectrum. This makes infrared spectroscopy useful for several types of analysis.

Yahya Abdi I, Bartl M, Dakna M, Abdesselem H, Majbour N, Trenkwalder C, El Agnaf O, Mollenhauer B. Cross-sectional proteomic expression in Parkinson’s disease-related proteins in drug-naïve patients vs healthy controls with longitudinal clinical follow-up. Neurobiology of Disease. MS NBD-22-775R. Accepted Jan 2023.

Areej Mesleh, Hanan Ehtewish, Katie Lennard, Houari Abdesselem, Fouad Al- Shaban, Julie Decock, Nehad M. Alajez, Abdelilah Arredouani, Mohamed M. Emara, Omar Albagha, Lawrence w. Stanton, Sara A. Abdulla, Jonathan M. Blackburn, Omar M.A. El-Agnaf. High-throughput Autoantibody Screening Identifies Differentially Abundant Autoantibodies in Autism Spectrum Disorder. Frontiers in Molecular Neuroscience, section Brain Disease Mechanisms. Accepted, Sep 2023.

Sectioning is a technique used to reduce specimen size for easier handling and to fit in other equipment. Buehler IsoMet 5000 Linear Precision Saw The IsoMet 5000 linear precision saw is capable of automated and repeatable sectioning of hard materials. It also includes a smart cut function where it reduces the feed rate when hitting a particularly hard section to prevent damaging the sample and the machine.

Oxford Instruments™ RF sputtering system can sputter on planar substrates maximum up to 8” wafer in size, hence, it keeps the space of accommodating various substrate sizes as per application needs. The system has four RF magnetron with a dedicated RF power supply. The system has three Mass Flow Controllers (MFCs) that are currently being used for the sputter gas. Generally, in a sputtering tool, a permanent magnet is set up behind the cathode-which is in contact with the loaded target to create electronic traps.

Al-Nesf M.A.Y, Abdesselem HB, Bensmail I, Ibrahim S, Saeed WAH, Mohammed SSI, Razok A, Alhussain H, Aly RMA Al Maslamani M, Ouararhni K, Khatib M.Y, Ait Hssain A, Omrani A.S, Al-Kaabi S, Al Khal A, Al-Thani A.A, Samsam W, Farooq A, Al-Suwaidi J, Al-Maadheedh M, Al-Siddiqi H.H, Butler A.E, Decock J.V, Mohamed-Ali V and Al-Ejeh F. Prognostic tools and candidate drugs based on plasma proteomics of patients with severe COVID-19 complications. Nature Commun. 2022 Feb 17;13(1):946.doi: 10.1038/s41467-022-28639-4.

X-ray diffraction (XRD) is a widely used nondestructive method in materials science, geology, environmental science, and biology for determining the atomic and molecular arrangements in crystalline materials. The technique involves irradiating a crystal with incident X-rays and measuring the intensities and angles of the scattered X-rays. The intensity of the scattered Xrays is then plotted as a function of the scattering angle, and the structure of the material is determined from the analysis of the location, in angle, and the intensities of scattered intensity peaks.

Optical microscopy is often the starting point for successful materials related failure and root cause analysis. It helps clients fully understand microstructure and other materials properties. The goal of optical microscopy is to produce clear and high quality images with high magnification (up to 1000X). Upright microscopes are the most common type, where the objective lens is above the stage and lighting system can be from top (reflected, bright field), bottom (transmitted) or sides (reflected, dark field).