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121

The Gatan Precision Ion Polishing System II is used to mill dimpled samples to electron transparency as a cheaper alternative to FIB milling. It is also used to clean unwanted redeposition off of TEM lamellae made by FIB.

Corelab Page Type
Techniques
Corelab Type
Materials Characterization Lab
Drupal 7 nid
31700
Sub lab
Sample Preparation Lab
Techniques PDF Link
https://www.hbku.edu.qa/sites/default/files/tem_sample_preparation_0.pdf
all_sub_lab
Microscopy and Microanalysis Lab
Nuclear Magnetic Resonance Lab
Thin Film Deposition Lab
Sample Preparation Lab
Spectroscopy Lab
X-rays Lab
Surface Analysis Lab
Surface Metrology and Profilometry Lab
Thermal Analysis Lab
Thin Film Characterization Lab
Thin Film Lab
all_year
2024
2023
2022
2021
Techniques image
tem_sample_preparation_0.png