X-ray diffraction (XRD) is a widely used nondestructive method in materials science, geology, environmental science, and biology for determining the atomic and molecular arrangements in crystalline materials. The technique involves irradiating a crystal with incident X-rays and measuring the intensities and angles of the scattered X-rays. The intensity of the scattered Xrays is then plotted as a function of the scattering angle, and the structure of the material is determined from the analysis of the location, in angle, and the intensities of scattered intensity peaks. In addition to measuring the average positions of atoms in the crystal, XRD provides valuable information on the degree of order or disorder within a material, the presence of internal stress, and the presence of defects. This information is crucial for understanding the properties and behavior of materials under various conditions, as well as for developing new materials with specific properties.