Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is an analytical technique used to study the chemical composition and molecular structure of the surfaces of materials at the nanoscale. It has become an essential tool in the fields of materials science, surface chemistry, and biomedicine, among others. In this technique, a primary ion beam is used to sputter secondary ions from the surface of the sample. These ions are then mass-analyzed based on their time of flight to a detector, providing information on their mass-to-charge ratio and abundance.

The microhardness tester makes an indent using a specialized indenter and holding for a set period. The user then measures the diagonals of the indents, and the tester automatically calculates the hardness. The testing parameters, such as the type of indenter, force and holding time, can be changed by users to match their requirements.

Thermogravimetric analysis (TGA) is a technique used to measure changes in sample weight as a function of temperature or time. This technique is valuable because even small changes in a sample's weight can provide a wealth of information about its chemical and physical properties. The sensitivity and quality of the balance used in TGA allows for precise measurements of even small changes in sample weight, enabling researchers to gain insight into various phenomena that affect the sample, such as vaporization, sublimation, absorption, adsorption, and desorption.

X-ray Photoelectron Spectroscopy (XPS) is an analytical technique that provides information on the chemical composition, elemental distribution, and chemical bonding state of the surface of a material. It is based on the photoelectric effect, which is a fundamental principle in quantum mechanics that explains the interaction between photons and matter. When a photon of sufficient energy is absorbed by an atom in a material, an electron is ejected from that atom, resulting in the emission of a photoelectron.

Planetary ball milling is a technique for reducing and homogenizing the average particle size of powder samples. This can also be used for mixing different powder samples into a homogenous mixture. This technique is mainly used for preparing samples for powder XRD and XRF. Our laboratory houses two (2) variant models of Retsch planetary ball mills, only differing in the number of ball jars, the volumetric capacity of each ball jar and maximum rotational speed. Both models are capable of storing 10 custom SOP’s, direction reversal and interval operation.

A Hall Effect Measurement System (HEMS) is a powerful scientific instrument used to measure the electrical properties of materials. It uses the Hall Effect, a physical phenomenon discovered by Edwin Hall in 1879, to measure the voltage generated when a current flows through a material placed in a magnetic field. The HEMS system typically consists of a sample holder, a magnet, a current source, and a voltmeter.

Small Angle X-Ray Scattering (SAXS) is a powerful analytical technique used to study the nanostructure and morphology of materials. The X-ray source emits an X-ray beam that interacts with the electrons of the sample and is scattered. The detected scattering pattern is characteristic for the nanostructures of the sample and can be used to determine important structural parameters such as particle size

Contact angle measurement is a powerful technique used to determine the wetting properties of a solid surface. It measures the angle formed by the tangent to the liquid-solid interface at the point where a liquid droplet meets a solid surface. The contact angle is a crucial parameter in understanding the interaction between a liquid and a solid surface, and it is widely used in many scientific and industrial applications.

The PP 40 is a programmable press that goes up to 40 t. It allows Ø 40 mm pellets to be made using exactly defined routines and pressure parameters (maximum pressure, ramp up, ramp down and holding time) resulting in repeatable quality.

X-ray fluorescence (XRF) is a powerful analytical technique widely used to determine the chemical composition of a sample. XRF is based on the interaction of X-rays with the electrons of atoms in a sample, which creates a fluorescent Xray with a discrete energy characteristic of the atom and its chemical environment. The emitted X-rays are then measured by a detector, and the intensity and energy of the X-rays provide information about the elements present in the sample.