Atomic Force Microscopy (AFM) is a high-resolution imaging technique used to study surfaces at the atomic and molecular levels. AFM can observe surfaces that are too small to be seen with traditional microscopy, such as individual atoms or molecules, and has become a vital tool in the field of nanotechnology. The AFM probe consists of a sharp tip attached to a cantilever. The tip is brought close to the sample surface, and the cantilever is deflected by the forces acting on the tip as it scans over the surface in a raster pattern.

Mesleh A, Ehtewish H, de la Fuente A, Al-shamari H, Ghazal I, Al-Faraj F, Al-Shaban F, Abdesselem HB, Emara M, Alajez NM, Arredouani A, Decock J, Albagha O, Stanton LW, Abdulla S and El-Agnaf OMA. Blood Proteomics Analysis Reveals Potential Biomarkers and Convergent Dysregulated Pathways in Autism Spectrum Disorder: A Pilot Study. Int. J. Mol. Sci. 2023, 24(8), 7443.